ARIKAWA SHUICHI
Department Undergraduate School , School of Science and Technology Position Associate Professor |
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Language | English |
Publication Date | 2011 |
Type | International Conference |
Peer Review | Peer reviewed |
Title | Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance |
Contribution Type | Co-authored (first author) |
Journal | Proceedings of the International Conference on Advanced Technology in Experimental Mechanics 2011 |
Volume, Issue, Page | pp.1-11 |
Author and coauthor | S. Arikawa, Y. Nakaya, S. Yoneyama |