ARIKAWA SHUICHI
Department Undergraduate School , School of Science and Technology Position Associate Professor |
|
Date | 2011/09 |
Presentation Theme | Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance |
Conference | International Conference on Advanced Technology in Experimental Mechanics 2011 |
Conference Type | International |
Presentation Type | Speech (General) |
Contribution Type | Collaborative |
Venue | Kobe |
Publisher and common publisher | S. Arikawa, Y. Nakaya, S. Yoneyama |