ノグチ ユタカ
NOGUCHI Yutaka
野口 裕 所属 明治大学 理工学部 職種 専任教授 |
|
言語種別 | 英語 |
発行・発表の年月 | 2025/04 |
形態種別 | 学術雑誌 |
査読 | 査読あり |
標題 | Impact of Spontaneous Orientation Polarization in the Emission Layer on the Charge Accumulation and Exciton−Polaron Quenching Properties of Ir-Complex-based Organic Light-Emitting Diodes |
執筆形態 | 共著(筆頭者以外) |
掲載誌名 | ACS Applied Electronic Materials |
掲載区分 | 国外 |
出版社・発行元 | American Chemical Society |
総ページ数 | 9 |
担当区分 | 最終著者,責任著者 |
著者・共著者 | Shotaro Nakano, Yutaka Noguchi |
概要 | This study investigates the impact of spontaneous orientation polarization (SOP) in the emission layer (EML) on the charge accumulation and exciton-polaron quenching (EPQ) characteristics of Ir-complex-based organic light-emitting diodes (OLEDs) using displacement current measurements combined with photoluminescence intensity measurements and device simulations. A significant SOP is induced in the EML depending on the SOP-active material content, which modifies the accumulated charge distribution in the EML. Notably, the SOP can suppress the EPQ, particularly when the energy offset at the interface between the hole transport layer and the EML is small. These findings highlight the importance of SOP in optimizing the OLED device performance. |
DOI | 10.1021/acsaelm.5c00355 |