ノグチ ユタカ
NOGUCHI Yutaka
野口 裕 所属 明治大学 理工学部 職種 専任教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2016/01 |
形態種別 | 学術雑誌 |
査読 | 査読あり |
標題 | Significant relaxation of residual negative carrier in polar Alq3 film directly detected by high-sensitivity photoemission |
執筆形態 | 共著(筆頭者以外) |
掲載誌名 | Applied Physics Express |
掲載区分 | 国外 |
出版社・発行元 | IOP science |
巻・号・頁 | 9(2),pp.021601-1-021601-4 |
著者・共著者 | ◎Hiroumi Kinjo, Hyunsoo Lim, Tomoya Sato, Yutaka Noguchi, Yasuo Nakayama, and Hisao Ishii |
概要 | Tris(8-hydroxyquinoline)aluminum (Alq3) has been widely applied as a good electron-injecting layer (EIL) in organic light-emitting diodes. Highsensitivity photoemission measurement revealed a clear photoemission by visible light, although its ionization energy is 5.7 eV. This unusual photoemission is ascribed to Alq3 anions captured by positive polarization charges. The observed electron detachment energy of the anion was about 1 eV larger than the electron affinity reported by inverse photoemission. This difference suggests that the injected electron in the Alq3 layer is energetically relaxed, leading to the reduction in injection barrier. This nature is one of the reasons why Alq3 worked well as the EIL. |
DOI | http://doi.org/10.7567/APEX.9.021601 |