ノグチ　ユタカ   NOGUCHI Yutaka   野口　裕    所属   明治大学  理工学部    職種   専任教授
言語種別	英語
発行・発表の年月	2017/02
形態種別	学術雑誌
査読	査読あり
標題	Degradation Process in Pentacene-Based Organic Field-Effect Transistors Evaluated by Three-Terminal Capacitance-Voltage Measurements
執筆形態	共著(筆頭者以外)
掲載誌名	MRS Advances
掲載区分	国外
著者・共著者	Yuya Tanaka, Kohei Yamamoto, Yutaka Noguchi, Hisao Ishii
概要	By taking advantage of three-terminal capacitance-voltage (TT-CV) measurement, we investigated a formation of trapped charge in pentacene(Pn)-based organic field-effect transistors (OFETs) during the bias stress measurement. The shift of the turn-on voltage in transfer curve correlated well with the increase of trapped charge estimated from TT-CV curves. Moreover, TT-CV measurement revealed that the trapped charges were distributed inhomogeneously at the vicinity of the pentacene/insulator interface, indicating that the current does not obviously affect their formation. Thus we suggested that the trapped charges are formed by keeping Pn molecules as unstable cation (hole state) by the prolonged bias stress.
DOI	10.1557/adv.2017.225