イグチ ユキヒロ
Iguchi Yukihiro
井口 幸洋 所属 明治大学 理工学部 職種 専任教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2008/09 |
形態種別 | 国際会議議事録 |
標題 | On the complexity of single-digit error detection function in redundant residue number system |
執筆形態 | 共著(筆頭者以外) |
掲載誌名 | Proc. of 10th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools |
著者・共著者 | T. Sasao and Y. Iguchi |
概要 | This paper considers a single-digit error detection in a Redundant Residue Number System (RRNS). Let f be the fnction that denotes the set of legitimate codes of an RRNS. To analyze the complexity of the error detection circuit, C-measure, the maximum value of the column multiplicity for f is considered. We show that the C-measure is much smaller than the dynamic range of the RRNS. In this way, we show that f can be implemented by a small Look-up table (LUT) cascade. |