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NOGUCHI Yutaka
Department Undergraduate School , School of Science and Technology Position Professor |
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| Language | English |
| Publication Date | 2021/05 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Title | Investigating Bulk-to-Interface Doping Relaxation in Light-Emitting Electrochemical Cells via Displacement Current Measurements |
| Contribution Type | Co-authored (other than first author) |
| Journal | ACS Applied Electronic Materials |
| Journal Type | Another Country |
| Publisher | ACS publications |
| Volume, Issue, Page | 3(5),pp.2355-2361 |
| Total page number | 7 |
| Authorship | Last author,Corresponding author |
| Author and coauthor | Hayato Iwakiri, Hotaka Watanabe, Yutaka Noguchi |
| Details | In the present work, this extended DCM method was employed for Super Yellow-based LECs with two typical active layer thicknesses of approximately 60 and 120 nm, and the relaxation processes of the resulting devices were investigated. In the thick-film device, the deterioration of the luminous efficiency was dominated by the optical processes of self-absorption and exciton–polaron quenching, whereas in the thin-film device, the deterioration was facilitated by the electronic process of carrier injection. The carrier balance factor was critical to the luminous efficiency of the thin-film device under reverse-bias operation, although this was not the case for the thick-film device. The results indicate that the ECD relaxation propagates from the bulk to the interface and confirm that the active layer thickness is a major factor in the maintenance of efficient carrier injection. The extended DCM method is a promising approach for analyzing the dynamic and complex properties of LECs. |
| DOI | 10.1021/acsaelm.1c00237 |