Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Language English
Publication Date 2011
Type International Conference
Peer Review Peer reviewed
Title Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance
Contribution Type Co-authored (first author)
Journal Proceedings of the International Conference on Advanced Technology in Experimental Mechanics 2011
Volume, Issue, Page pp.1-11
Author and coauthor S. Arikawa, Y. Nakaya, S. Yoneyama