|
ARIKAWA SHUICHI
Department Undergraduate School , School of Science and Technology Position Associate Professor |
|
| Language | English |
| Publication Date | 2011 |
| Type | International Conference |
| Peer Review | Peer reviewed |
| Title | Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance |
| Contribution Type | Co-authored (first author) |
| Journal | Proceedings of the International Conference on Advanced Technology in Experimental Mechanics 2011 |
| Volume, Issue, Page | pp.1-11 |
| Author and coauthor | S. Arikawa, Y. Nakaya, S. Yoneyama |