Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Language English
Publication Date 2019/10
Type International Conference
Title A new phase analysis method using mean intensity on speckle interferometry for measuring dynamic phenomena
Contribution Type Co-authored (other than first author)
Journal Proceedings of SPIE Volume 11205, Seventh International Conference on Optical and Photonic Engineeri
Journal TypeAnother Country
Volume, Issue, Page 11205
Total page number 5
Author and coauthor K. Takahashi, S. Arikawa