Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Language English
Publication Date 2012
Type Academic Journal
Peer Review Peer reviewed
Title Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance
Contribution Type Co-authored (first author)
Journal Journal of Solid Mechanics and Materials Engineering
Volume, Issue, Page 6(6),pp.634-644
Author and coauthor S. Arikawa, Y. Nakaya and S. Yoneyama