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ARIKAWA SHUICHI
Department Undergraduate School , School of Science and Technology Position Associate Professor |
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| Language | English |
| Publication Date | 2012 |
| Type | Academic Journal |
| Peer Review | Peer reviewed |
| Title | Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance |
| Contribution Type | Co-authored (first author) |
| Journal | Journal of Solid Mechanics and Materials Engineering |
| Volume, Issue, Page | 6(6),pp.634-644 |
| Author and coauthor | S. Arikawa, Y. Nakaya and S. Yoneyama |