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Iguchi Yukihiro
Department Undergraduate School , School of Science and Technology Position Professor |
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| Language | English |
| Publication Date | 2002/01 |
| Type | International Conference |
| Title | A Method for Storing Fail Bit Maps in Burn-in Memory Testers |
| Contribution Type | Co-authored (other than first author) |
| Journal | Proc. of the The First IEEE International Workshop on Electronic Design, Test and Applications |
| Author and coauthor | A. Iseno and Y. Iguchi |