Iguchi Yukihiro    Department   Undergraduate School  , School of Science and Technology    Position   Professor
Language	English
Publication Date	2008/09
Type	International Conference
Title	On the complexity of single-digit error detection function in redundant residue number system
Contribution Type	Co-authored (other than first author)
Journal	Proc. of 10th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools
Author and coauthor	T. Sasao and Y. Iguchi
Details	This paper considers a single-digit error detection in a Redundant Residue Number System (RRNS). Let f be the fnction that denotes the set of legitimate codes of an RRNS. To analyze the complexity of the error detection circuit, C-measure, the maximum value of the column multiplicity for f is considered. We show that the C-measure is much smaller than the dynamic range of the RRNS. In this way, we show that f can be implemented by a small Look-up table (LUT) cascade.