YOKOGAWA RYO
   Department   Undergraduate School  , School of Science and Technology
   Position   Assistant Professor
Language English
Publication Date 2019/04
Type Academic Journal
Peer Review Peer reviewed
Title Evaluations of minority carrier lifetime in floating zone Si affected by Si insulated gate bipolar transistor processes
Contribution Type Co-authored (other than first author)
Journal Japanese Journal of Applied Physics
Journal TypeAnother Country
Volume, Issue, Page 58(SB),pp.SBBD07-SBBD07
Author and coauthor Hiroto Kobayashi, Ryo Yokogawa, Kosuke Kinoshita, Yohichiroh Numasawa, Atsushi Ogura, Shin-ichi Nishizawa, Takuya Saraya, Kazuo Ito, Toshihiko Takakura, Shin-ichi Suzuki, Munetoshi Fukui, Kiyoshi Takeuchi, Toshiro Hiramoto