YOKOGAWA RYO
Department Undergraduate School , School of Science and Technology Position Assistant Professor |
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Language | English |
Publication Date | 2015/05 |
Type | Academic Journal |
Peer Review | Peer reviewed |
Title | On the Origin of the Gate Oxide Failure Evaluated by Raman Spectroscopy |
Contribution Type | Co-authored (first author) |
Journal | ECS Transactions |
Journal Type | Another Country |
Volume, Issue, Page | 66(4),pp.237-243 |
Author and coauthor | Ryo Yokogawa, Motohiro Tomita, Toshikazu Mizukoshi, Takehiro Hirano, Kenichiro Kusano, Katsuhiro Sasaki, Atsushi Ogura |