KANEKO Hiromasa    Department   Undergraduate School  , School of Science and Technology    Position   Associate Professor
Date	2016/07/26
Presentation Theme	Generative Topographic Mapping Similarity Index Applied for Fault Detection in Chemical Plants.
Conference	PSE ASIA 2016
Conference Type	International
Presentation Type	Speech (General)
Contribution Type	Collaborative
Venue	Tokyo, Japan
Publisher and common publisher	M. S. Escobar, K. Funatsu