ARIKAWA SHUICHI    Department   Undergraduate School  , School of Science and Technology    Position   Associate Professor
Date	2016/09
Presentation Theme	Bending Deformation Measurement of Thin Film Cross-section by Electronic Speckle Pattern Interferometry
Conference	The Eleventh International Symposium on Mechanics, Aerospace and Informatics Engineering 2016
Conference Type	International
Presentation Type	Speech (General)
Contribution Type	Collaborative
Country	Japan
Venue	Tokyo
Publisher and common publisher	R. Ishikawa, S. Arikawa