Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Date 2016/09
Presentation Theme Bending Deformation Measurement of Thin Film Cross-section by Electronic Speckle Pattern Interferometry
Conference The Eleventh International Symposium on Mechanics, Aerospace and Informatics Engineering 2016
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Country Japan
Venue Tokyo
Publisher and common publisher R. Ishikawa, S. Arikawa