Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Date 2011/09
Presentation Theme Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance
Conference International Conference on Advanced Technology in Experimental Mechanics 2011
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Venue Kobe
Publisher and common publisher S. Arikawa, Y. Nakaya, S. Yoneyama