ARIKAWA SHUICHI    Department   Undergraduate School  , School of Science and Technology    Position   Associate Professor
Date	2011/09
Presentation Theme	Electronic Speckle Pattern Interferometry with Optimum Image Extraction for Deformation Measurement under Environmental Disturbance
Conference	International Conference on Advanced Technology in Experimental Mechanics 2011
Conference Type	International
Presentation Type	Speech (General)
Contribution Type	Collaborative
Venue	Kobe
Publisher and common publisher	S. Arikawa, Y. Nakaya, S. Yoneyama