ARIKAWA SHUICHI    Department   Undergraduate School  , School of Science and Technology    Position   Associate Professor
Date	2012/11
Presentation Theme	Deformation Measurement under Environmental Disturbance Using Electronic Speckle Pattern Interferometry with Optimum Image Extraction
Conference	ISEM-ACEM-SEM-7th ISEM'12
Conference Type	International
Presentation Type	Speech (General)
Contribution Type	Collaborative
Venue	Taipei
Publisher and common publisher	S. Arikawa, K. Ashizawa and S. Yoneyama