Department   Undergraduate School  , School of Science and Technology
   Position   Associate Professor
Date 2015/09
Presentation Theme Full-field Deformation Measurement Using Random and Repeated Patterns: a Comparison Study on Digital Image Correlation and Sampling Moiré Method
Conference International Conference on Advanced Technology in Experimental Mechanics 2015
Conference Type International
Presentation Type Speech (General)
Contribution Type Collaborative
Venue Toyohashi
Publisher and common publisher S. Ri, Q. Wang, S. Arikawa and S. Yoneyama