YOKOGAWA RYO
   Department   Undergraduate School  , School of Science and Technology
   Position   Assistant Professor
Date 2018/11/19
Presentation Theme Minority carrier lifetime degradation in FZ-Si by advanced Si-IGBT processes
Conference The Forum on the Science and Technology of Silicon Materials 2018
Conference Type Workshop/Symposium
Presentation Type Poster
Contribution Type Collaborative
Publisher and common publisher Hiroto Kobayashi, Ryo Yokogawa, Kosuke Kinoshita, Yohichiroh Numasawa, Atsushi Ogura, Shin-ichi Nishizawa, Takuya Saraya, Kazuo Ito, Toshihiko Takakura, Shin-ichi Suzuki4, Munetoshi Fukui, Kiyoshi Takeuchi, Toshiro Hiramoto